In - Beam Test of Double - Sided Silicon Strip Detector
نویسندگان
چکیده
The response of a double-sided silicon strip detector to a 3 GeV pion beam from the Proton Synchrotron at CERN is presented. Charge matching between the pulseheights from both sides, produced by the same traversing particle, is obtained with a resolution better than 5%. The spatial resolution is measured as a function of the incident angle of the projectile, varying from 15 m at normal incidence to 32 m at 45o. The contribution of multiple scattering to the spatial resolution is estimated to 11 m. 1
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